NICDA Research Group
NICDA Research Group
Home
News
Events
People
Publications
Jobs
Contact
Manuscript
Bootstrap confidence intervals: A comparative simulation study
Bootstrap is a widely used technique that allows estimating the properties of a given estimator, such as its bias and standard error. …
Vinícius Litvinoff
,
V. Batista Rodrigues
,
A. Dos Santos Sousa
Cite
DOI
Eigenvalues approximation of integral covariance operators with applications to weighted $L^2$ statistics
Finding the eigenvalues connected to the covariance operator of a centred Hilbert-space valued Gaussian process is genuinely considered …
Bruno Ebner
,
M. D. Jiménez-Gamero
,
B. Milošević
Cite
DOI
fsemipar: An R package for SoF semiparametric regression
Functional data analysis has become a tool of interest in applied areas such as economics, medicine, and chemistry. Among the …
Silvia Novo
,
G. Aneiros
Cite
DOI
A general maximal projection approach to uniformity testing on the hypersphere
We propose a novel approach to uniformity testing on the $d$-dimensional unit hypersphere $\mathcal{S}^{d−1}$ based on maximal …
J. Borodavka
,
Bruno Ebner
Cite
DOI
Independent additive weighted bias distributions and associated goodness-of-fit tests
We use a Stein identity to define a new class of parametric distributions which we call “independent additive weighted bias …
Bruno Ebner
,
Y. Swan
Cite
DOI
Is the Gompertz family a good fit to your data?
That data follow a Gompertz distribution is a widely used assumption in diverse fields of applied sciences, e.g., in biology or when …
D. Dobler
,
Bruno Ebner
Cite
DOI
Stein's method of moments
Stein operators allow to characterise probability distributions via differential operators. Based on these characterisations, we …
Bruno Ebner
,
A. Fischer
,
R. E. Gaunt
,
B. Picker
,
Y. Swan
Cite
DOI
Higher order differential analysis with vectorized derivatives
Higher order derivatives of functions are structured high dimensional objects which lend themselves to many alternative …
José E. Chacón
,
T. Duong
Cite
DOI
«
Cite
×